Journal: Materials

Article Title: Interface Structures on Mechanically Polished Surface of Spinel Ferrite and Its Effect on the Magnetic Domains

doi: 10.3390/ma17143509

Figure Lengend Snippet: (111) surface of NiFe 2 O 4 single crystal (( a ) SEM image) and electron backscattered diffraction (EBSD) inverse pole figure of (111) surface ( b ). Cross-sectional view of (111) surface of NiFe 2 O 4 single crystal before (( c ) ADF images) and after polishing (( d ) TEM image). EELS Fe L 2,3 edge ( e ) and Ni L 2,3 edge ( f ) line-scan for polished (111) surface. Chemical red shift of Fe L 3 edge toward lower loss direction is highlighted by black vertical lines and blue arrow. The scale bars are 200 μm in ( a ), 5 μm in ( b ), and 100 nm in ( c , d ).

Article Snippet: Lorentz transmission electron microscopy (Hillsboro, OR, USA, Thermo Fisher, Talos F200s) and in situ heating TEM holder (Pleasanton, CA, USA, Gatan 652) were used to observe the dynamic domain wall.

Techniques:

Journal: ACS nano

Article Title: Real-Time TEM Observation of the Role of Defects on Nickel Silicide Propagation in Silicon Nanowires.

doi: 10.1021/acsnano.4c01060

Figure Lengend Snippet: Figure 1. Overview of sample preparation for in situ heating experiment. (a−c) SLS growth of Si−Ni branched NWs through the deposition of Sn nanoparticles (NPs) on the sidewall of the Ni NW stem and the introduction of liquid silicon precursor. (d) Top view of NW transferred to a heating chip for in situ TEM heating experiment. (e) HAADF STEM image of Si−Ni branched NW with elemental maps of Sn (blue), Si (red), and Ni (green) regions of the NW.

Article Snippet: Then, the chip was placed in the built-in slot of a specialized in situ TEM heating holder (DENSsolutions Wildfire/ Lightning TEM holder) and inserted into the TEM.

Techniques: Sample Prep, In Situ